Analysis, test and measurement

PRESS RELEASE

AQ6375B

Yokogawa's new AQ6375B is an optical spectrum analyser operating in the short-wavelength infrared (SWIR) region covering wavelengths from 1200 to 2400 nm

PRESS RELEASE

OL 770-NVS

Gooch & Housego Instruments has introduced improvements to its OL 770-NVS night vision display test and measurement system, a complete solution for measurement of NVG-compatible lighting and displays

PRESS RELEASE

ZeGage Plus

The ZeGage Plus optical profiler, a full-featured instrument for the 3D measurement of surface topography and roughness has been announced by Zygo Corporation

PRESS RELEASE

H13126 PMT module

A new photomultiplier tube module that offers wide dynamic range for applications such as chemiluminescence measurement and semiconductor inspection has been developed by Hamamatsu Photonics

PRESS RELEASE

AccuFiz Fizeau

4D Technology Corporation, manufacturer of optical metrology systems, has introduced its newly improved AccuFiz compact laser interferometer for accurate, repeatable measurement of surface shape and transmitted wavefront quality

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